The LK-G series uses a 655 nm semiconductor laser with a spot size as small as 25 μm diameter, enabling measurement of fine surface features without contact. Sampling rates up to 50 kHz allow in-line inspection at production line speeds exceeding 1,000 parts per minute. Multiple sensors can be synchronised via a controller hub for simultaneous multi-axis profile capture. EtherNet/IP, RS-232, and analogue output interfaces cover most PLC and data acquisition environments. Built-in digital display shows live displacement values without a separate controller in maintenance mode.